The Scanning Confocal Electron Microscope (SCEM) is an electron-optical implementation of the Scanning Confocal Optical Microscope. The SCEM merges the concept of confocal imaging with the ease of an SEM, and the penetration ability of both the Scanning Transmission X-ray Microscope (STXM) and the Transmission/Scanning Transmission Electron Microscope (TEM/STEM). The SCEM enables imaging of subsurface features of optically opaque materials which heretofore required the use of an X-ray Microscope, yet it provides both large fields of view as well as a nanometer scale spatial resolution. The SCEM functions as much as 100 times faster than the STXM, yet can be constructed for only a fraction of the cost.

Bio Sketch
Nestor J. Zaluzec is currently a research scientist and principle investigator for the Advanced AEM and TelePresence Collaboratory Projects in the Materials Science Division of Argonne National Laboratory. He is also an Adjunct Professor of Physics at UIC and NIU, receiving his BS in Physics from IIT in 1973 and his PhD in Metallurgy from the UIUC in 1978. As an instrument scientist, Nestor's main research interestes are divided into both R&D and applications to materials science. They include: Analytical Electron Microscopy, electron optics, X-ray and electron spectroscopy, electron diffraction, irradiation effects/damage, magnetism, TelePresence Collaboration and computationally mediated experimental science.

Nestor also spends a modicum of time on the Net in various roles including being the SysOp for resources for society and microscopy community worldwide. On a good day you might also find him in his TPMlab at http://tpm.amc.anl.gov.

Minutes: SMSI Scanning Confocal Electron Microscope. Dr. Nestor Zaluzec. 21 May 2004
Working at the Frontiers of Materials Characterization in shorter wave length -- electron, gamma ray, Zaluzec compares his work to Minsky 1961 who invented confocal imaging: remove extraneous beams after using a wide angle beam to a very small focal point. Richard P. Feynman, 1959 "There's Plenty of Room at the Bottom" That's where the Z's are as in Zaluzec who met Feynman's challenge in decreasing aberation to 5 Microns in opaque materials.

Respectfully submitted, Stan Schmidt, Recording Secretary