6:00 PM: Thai Food & Beverages ~ Tariff: $15.00 (if eating)
Contact Freddie Smith for Reservations / Cancellations at 312-842-7100 or Freddie@mcri.org by noon Thursday, October 11, 2018

7:00 PM: Presentation
Present electron microscope instrumentation ranges from high resolution transmission electron microscopes (TEM) with scanning electron capability to tabletop scanning electron microscopes that take a minimal amount of lab space. The environmental and low vacuum SEM’s permits imaging samples without having to apply a conductive carbon or gold coating. The use of low accelerating voltages (1-5 kV) reduces non-conductive sample charging and also provides higher resolution of surface features. The magnification of high resolution scanning electron microscopes have magnifications as high as 2 million times. Other advances include simultaneous acquisition of normal secondary electron imaging, backscatter electron imaging and topographic imaging as well as superimposing elemental maps. Real time 3D imaging observation is also possible. Atomic force microscopy involves rastering a needle probe over a sample surface to obtain topographic information with resolution 1000 times that of optical light microscopy.

Bio Sketch: Bob Passeri is the Midwest Sales Manager for Hitachi High Technologies America. He has extensive experience operating, installing and repairing electron microscopes from the 300 kV transmission electron microscopes (TEM) to the 30 kV scanning electron microscopes (SEM). In the past, he has trained and helped customers obtain the best SEM imaging and elemental analyses, and did extensive SEM investigations for the Bodycote Company. Bob has a Masters Degree in material science from the University of Wisconsin – Madison and a Bachelors Degree in physics and mathematics from DePaul University.

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